Ion Beam Analysis

21st Ion Beam Analysis

IBA logo

The 21st International Conference on Ion Beam Analysis (IBA – 2013) hosted by the Pacific Northwest AVS chapter (PNWAVS), in cooperation with the International Atomic Energy Agency (IAEA), will be held at the Marriott Waterfront in Seattle, Washington, USA on June 23-28, 2013. This marks the 40th anniversary of the IBA forum which started in 1973 with 91 participants. The forum has grown to over 300 participants and we will celebrate the 40th anniversary during the banquet in Seattle.

The International Conference on Ion Beam Analysis is a forum where scientists, industry professionals, professors and students from all over the world discuss the recent advances and future prospects in ion beam analysis. Traditionally this international forum bring together physicists, material scientists, accelerator and ion beam specialists and those who are interested in the analysis of any material using low, medium and high energy ion beams.

Important Dates

  • Abstract submission site open: November 30, 2012
  • Conference registration is now open
  • Hotel reservation opens: Now
  • Abstract submission deadline (EXTENDED): April 1, 2013
  • Notification of accepted abstracts: April 15, 2013
  • Young Researcher for Best Manuscript Competition submission deadline: May 27, 2013
  • Early registration deadline: May 27, 2013
  • Preliminary program available online: May 31, 2013
  • Hotel reservation deadline: June 3, 2013
  • IBA 2013, June 23 - 28, 2013
  • Manuscript submission deadline: July 31, 2013

Additonal Information


Topics will include, but are not limited to:

  • Fundamentals of ion-solid interactions (Fundamentals of IBA)
    • Stopping and straggling
    • Cross sections
    • Ion induced luminescence
    • Modeling simulations
  • Applications of IBA
    • Materials science
    • Environmental science
    • Nuclear energy
    • Art and archaeometry
    • Geophysics: earth and planetary sciences
    • Biology and medicine
    • Forensics
  • Experimental developments and novel IBA techniques
    • Coupled and complementary analysis with other capabilities
    • Automated analysis
    • Analysis of inhomogeneous samples
    • Facilities and instrumentations
  • Ion Beam Imaging
    • Helium ion microscopy
    • Microprobe and nanoprobe imaging
    • Molecular and chemical imaging
    • Coupled imaging capabilities (FIB/APT/STEM)


Plenary Speakers: The following leading scientists have been invited to give plenary talks in the morning dedicated sessions.

  • Lucile Beck, Centre d'Etudes Nucléaires de Saclay, France
  • Iain Campbell, University of Guelph, Ontario, Canada
  • Keizo Ishii, Tohoku University, Japan
  • Tom Kelly, CAMECA Inc., USA
  • John A. Kilner, Imperial College, London, UK
  • Philippe Moretto, Centre d'Etudes Nucléaires de Bordeaux Gradignan, France
  • Michael Nastasi, University of Nebraska, USA
  • Xi Wang, Chinese Academy of Sciences, Shanghai, China
  • Frank Watt, Centre for Ion Beam Applications, National University of Singapore
  • Helmut Winter, Humboldt University of Berlin, Germany
  • James Ziegler, Aerospace Engineering Department, United States Naval Academy, USA

Invited Speakers

  • Melanie Bailey, "IBA Applications in Forensic Science" (UK)
  • Nuno Barradas, "IBA to Study Fusion First Wall Materials" (Portugal)
  • Lyudmila V Goncharova, "Medium energy elastic recoil detection analysis for thin films and monolayers" (Canada)
  • Agenor Hentz, "Stopping Power in Crystalline Materials" (Porto Allegre)
  • Dinakar Kanjilal, "Application of Ion Beams at Varied Energies from keV to hundreds of MeV for Characterization and Modification of Materials" (India)
  • John Kennedy, "Effect of gas and metal ion implantation to control the precipitation and growth of Fe nanoparticles in Silica" (New Zealand)
  • V S Nageswara Rao, "Ion beam studies of Hafnium based alternate high-k dielectric films deposited on silicon"(India)
  • Daniel Primetzhoferm, "Stopping of heavy ions at low energies of a few keV/amu: Velocity scaling, electronic and nuclear contributions" (Sweden)
  • Lin Shao, "Ion solid interactions in amorphous metallic glasses" (USA)
  • Toshio Seki, "Bio-imaging with MeV-energy Heavy Ion Beams" (Japan)
  • Liqiun Shi, "He and H Behavior and Analysis in Nuclear Reactor Material"(China)
  • Mitra Taheri, "Atom Probe Tomography" (USA)
  • Andrzej Turos, "Damage Accumulation in Compound Semiconductors" (Poland)
  • Dennis Whyte, "Advancing Fusion Energy Materials Research using Ion Beam Analysis" (USA)
  • Dharshana Wijesundera, "Channeling Simulations"(USA)
  • Tom Wirtz, "Correlative Microscopy using SIMS for High-Sensitivity Elemental Mapping"(Luxemburg)

IBA 2013 Conference

Attending the Conference